Elhadj Marwane Diallo

Lab Research Staff

​Lab Technician

Current

Social Profile:

Research Interests

​Main research interests are based on the study of material surfaces, thin films, and material characterization using different techniques such as Metrology tools, and Surface Spectroscopy Techniques.  Current research interests include specialized experiments in petrophysics, rock characterization, and coreflooding.  

Selected Publications

  • Water soluble nano-scale transient material germanium oxide for zero toxic waste based environmentally benign nano-....
    A.S. Almuslem, A.N. Hanna, T. Yapici, N. Wehbe, E.M. Diallo, A.T. Kutbee, R.R. Bahabry, M....
    Applied Physics Letters 110 (Issue 7), 074103 (2017)
  • Optical constants of CH3NH3PbBr3 perovskite thin films measured by spectroscopic Ellipsometry
    M.S. Alias, E.M. Diallo, B.S. Ooi
    Optics Express 24 (15), 16586-16594 (2016)
  • Focused-ion beam patterning of organolead trihalide Perovskite for subwavelegnth gratin nanophotonic applications
    M.S. Alias, I. Dursun, E. Diallo, D.Shi, M.I. Saidaminov, B.S. Ooi
    Journal of Vacuum Science & Technology B 33 (5), 051207 (2015)
  • Silicon wafer wettability and aging behaviors :Impact on gold thin-film morphology
    X.M. Yang, E.M.Diallo, Z.W.Zhon, W.S.Yue, Z.H.Wang
    Materials Science in Semiconductor Processing 26, 2532 (2014)
  • Synthesis of Copolymer Films by RF Plasma: Correlation between Plasma Chemistry and Film Characteristics
    Z.Li, X. Gillon, E.M. Diallo, J. Pireaux, L. Houssiau
    IEEE Transactions on Plasma Science, 41(3), 518-527, (2013)
  • The influence of metal interlayers on the structural and optical properties of nano-crystalline TiO2 films
    Y. Yang, Q. Zhang, B. Zhang, W.B. Mib, L. Chen, L. Lia, C. Zhao, E.M. Diallo, X.X. Zhang
    Applied Surface Science (2012)
  • A Comparative Study of Copolymerization by R.F. inductively coupled plasma
    Z. Li, X. Gillon, M. Diallo, L. Houssiau, J. J. Pireaux
    IEEE, 978-1-4244-5476-1/10 (2010)
  • Nano-Characterization of Silicon-Based Multilayers Using the Technique of STEM-EELS Spectrum-Imaging
    DH Anjum, IA Qattan, S Patole, EM Diallo, N Wei, H Heidbreder
    Materials Today Communications, 101209 (2020).

Education

  • ​M.A. Degree in Physical Engineering (Technology & Plasmas Applications), UJF, Grenoble, France, 2006                            
  • B.Sc. Degree in Electrical Engineering, University of Sherbrooke, Quebec, Canada / UJF, Grenoble, France, 2005

Professional Profile

  • ​2017-Present: Lab Technician, ANPERC, KAUST, Thuwal, Saudi Arabia
  • 2011-2017: Senior Technical Specialist, Nanofabrication Core Lab, KAUST, Thuwal, Saudi Arabia
  • 2008-2010: Process Engineer, Plasma surface, LISE, Namur, Belgium
  • 2008: Adjunct Professor of Remedial Courses in I.T., Boreal College, Toronto, Canada
  • 2006-2008 : Process Engineer (RIE/ICP Etching), NANOLYON, Lyon, France   

Scientific and Professional Membership

  • ​Materials Research Society (MRS)

Awards

  • ​Scholarship, Exchange Program, CREPUQ, France/Quebec, Canada, 2004
  • HSE Individual Lab Safety Award Winner, 2019

KAUST Affiliations

  • ​Ali I. Al-Naimi Petroleum Engineering Research Center (ANPERC)
  • Division of Physical Science and Engineering (PSE)

Research Interests Keywords

​Surface Characterization Thin Film Deposition Solid State Physics Semiconductor Rocks Characterization